Dimensional metrology of Nanoparticles (NP) in complex media

The nanometrology growth focuses on issues related to the reliability and the comparability of measurements on nanomaterials. Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) techniques are used in the metrology laboratories. Nowadays with the development of the SEM equipped with a field emission gun (FEG), where the resolution can achieve 1 nm whatever the accelerating voltage is. The calibration of the instrument allows the operator to make the measurements traceable. The choice of the measurement protocol is essential to achieve an accurate result. A metrological evaluation of each step is required.

  • Scanning Probe Microscopy
  • Electron Microscopy
  • Traceability for nanoscale measurments
  • muliphoton excited fluorescence

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