Dimensional metrology of Nanoparticles (NP) in complex media

The nanometrology growth focuses on issues related to the reliability and the comparability of measurements on nanomaterials. Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) techniques are used in the metrology laboratories. Nowadays with the development of the SEM equipped with a field emission gun (FEG), where the resolution can achieve 1 nm whatever the accelerating voltage is. The calibration of the instrument allows the operator to make the measurements traceable. The choice of the measurement protocol is essential to achieve an accurate result. A metrological evaluation of each step is required.

  • Scanning Probe Microscopy
  • Electron Microscopy
  • Traceability for nanoscale measurments
  • muliphoton excited fluorescence

Related Conference of Dimensional metrology of Nanoparticles (NP) in complex media

April 11-12, 2019

22nd World Nanotechnology Congress

Abu Dhabi, UAE
May 15-16, 2019 |

31st Annual Congress on Nanotechnology and Nanomaterials

Prague, Czech Republic
May 20-21, 2019

30th World Nano Conference

Zurich, Switzerland
May 27-28, 2019

18th World Medical Nanotechnology Congress and Expo

| Four Points by Sheraton | Taipei, Taiwan
Mar 25-26, 2019

21st Asia Pacific Nanotechnology Congress

Yokohama, Japan
August 29-31, 2019

31st Nano Congress for Future Advancements

London, UK
September 20-21, 2019

24th Annual Meeting on Nanomaterials Science


San Francisco, California, USA
October 10-11, 2019

32nd International Conference on Advanced Nanotechnology

Dublin, Ireland
October 16-17, 2019

22nd World Congress on Advances in Nanoscience and Nanotechnology

| Holiday Inn Atrium | Singapore
November 18-19, 2019

4th World Congress and Expo on Graphene & 2D Materials

Frankfurt, Germany

Dimensional metrology of Nanoparticles (NP) in complex media Conference Speakers

Recommended Sessions

Related Journals

Are you interested in