Nano-Metrology and Characterization


Nanotechnology involves the event and process of materials and systems at nanoscale. so correct management of dimensions of objects is very important in technology. Nanometrology, a subfield of science, considerations with science of measurements at nanoscale level. the most analysis during this filed is to develop or produce new activity techniques and standards to live the physical parameters of nanomaterials and nanodevices like length or size, force, mass, electrical, magnetic, and different properties.

Therefore, nanometrology plays a vital role in manufacturing nanomaterials and devices with a high degree of accuracy and responsibleness in nanomanufacturing. Some widespread instrumental techniques are used for measure or decisive the parameters for nanostructures and nanomaterials as well as X-ray diffraction, Transmission microscopy, High Resolution Transmission microscopy, Scanning Probe research, Scanning microscopy, emission Scanning microscopy etc. Nano characterization considerations the theoretical and sensible aspects of exploitation the nanometrological instruments to characterize the physical properties of nanomaterials, nanostructure, nanodevices, and nano systems.


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